Topics

Defect and Microstructure Analysis by Diffraction

15 March 2000

by R Snyder, J Fiala and H J Bunge, Oxford Science Publications, ISBN 0 19 850189 7 (£95, 780 pages).

9780198501893

In the International Union of Crystallography series of monographs, this comprehensive compilation of 31 chapters from different authors looks at the latest developments in X-ray diffraction techniques.

CERN Courier Jobs

Events

  • Astrophysics and cosmology | Symposium Lepton Photon 2025 25—29 August 2025 | Madison, US

  • Warning: Trying to access array offset on value of type null in /opt/app-root/src/wp-content/themes/iopp/modules/bright-recruits-item-events.php on line 36
    |
    Warning: Trying to access array offset on value of type bool in /opt/app-root/src/wp-content/themes/iopp/modules/bright-recruits-item-events.php on line 36

    Warning: Attempt to read property "name" on null in /opt/app-root/src/wp-content/themes/iopp/modules/bright-recruits-item-events.php on line 36
    33rd Texas Symposium on Relativistic Astrophysics 8—12 December 2025 | Tempe
bright-rec iop pub iop-science physcis connect